NDT & E Internationalに論文が公開されました

論文が公開されました．Experimental investigation of defect imaging using a phased array probe with a stacked plate bufferi, Xia Mingqian, Takahiro Hayashi, Naoki Mori, NDT & E International, Vol. 151, 103316, 2025　https://doi.org/10.1016/j.ndteint.2024.103316